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Identification of deep levels in π-GaN epilayers

Author(s):
  • Soh, C.B. ( National Univ. of Singapore )
  • Chi, D.Z. ( Institute of Materials Research and Engineering (Singapore) )
  • Lim, H.F. ( National Univ. of Singapore )
  • Chua, S.J. ( National Univ. of Singapore and Institute of Materials Research and Engineering (Singapore) )
Publication title:
Design, fabrication, and characterization of photonic devices : 27-30 November 2001, Singapore
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4594
Pub. Year:
2001
Page(from):
211
Page(to):
220
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443243 [0819443247]
Language:
English
Call no.:
P63600/4594
Type:
Conference Proceedings

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