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Thin film characterization using terahertz differential time-domain spectroscopy and double modulation

Author(s):
Mickan, S.P. ( Rensselaer Polytechnic Institute (USA) )
Lee, K.-S. ( Rensselaer Polytechnic Institute (USA) )
Lu, T.-M.
Barnat, E.
Munch, J. ( Adelaide Univ. (Australia) )
Abbott, D.
Zhang, X.-C. ( Rensselaer Polytechnic Institute (USA) )
2 more
Publication title:
Electronics and structures for MEMS II : 17-19 December 2001, Adelaide, Australia
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4591
Pub. Year:
2001
Page(from):
197
Page(to):
209
Pages:
13
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443212 [0819443212]
Language:
English
Call no.:
P63600/4591
Type:
Conference Proceedings

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