Blank Cover Image

Statistical characteristics of higher-order PMD and its impact on transmission systems

Author(s):
Zhao, W. ( Beijing Univ. of Posts and Telecommunications (China) )
Ji, Y.
Rasmussen, J.C. ( Fujitsu Research Labs., Ltd. (Japan) )
Ooi, H.
Ishikawa, G.
Hasuo, S. ( Fujitsu R&D Ctr. Co., Ltd. (China) )
1 more
Publication title:
Passive Components and Transmission Systems
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4581
Pub. Year:
2001
Page(from):
252
Page(to):
259
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443113 [0819443115]
Language:
English
Call no.:
P63600/4581
Type:
Conference Proceedings

Similar Items:

Wang, L., Zhao, W., Wang, H., Ji, Y., Rasmussen, J.C., Ooi, H., Ishikawa, G., Hasuo, S.

SPIE-The International Society for Optical Engineering

Wang H., Ji Y.

SPIE - The International Society of Optical Engineering

Qiao, Y.J., Zhao, W.Y., Wang, L., Wang, H.X., Ji, Y.F., Tao, Z.N., Saito, T., Rasmussen, J.C., Ooi, H., Ishikawa, G.

SPIE-The International Society for Optical Engineering

Zhao, W.Y., Wang, L., Wang, H.X., Ji, Y.F., Xu. D.X

SPIE-The International Society for Optical Engineering

Qiao, Y., Wang, H., Ji, Y., Saito, T., Ishikawa, G.

SPIE - The International Society of Optical Engineering

Zhao, W.Y., Wang, H.X., Wang, L., Ji, Y.F., Xu, D.X.

SPIE-The International Society for Optical Engineering

Lee, J.H., Chung, Y.C.

SPIE-The International Society for Optical Engineering

Overley,J.C., Chmelik,M.S., Rasmussen,R.J., Sieger,G.E., Schofield,R.M.S., Lefevre,H.W.

SPIE-The International Society for Optical Engineering

Wang, H., Ji, Y.

SPIE - The International Society of Optical Engineering

Zhao, W., Zhang, H., Ji, Y., Xu, D.

SPIE - The International Society of Optical Engineering

Hu H., Yu J., Wang J., Wang W., Gao Q., Yuan G., Zhang L., Yang E.

SPIE - The International Society of Optical Engineering

Lefevre,H.W., Rasmussen,R.J., Chmelik,M.S., Schofield,R.M.S., Sieger,G.E., Overley,J.C.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12