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Dispersion measurement of tapered air-silica microstructure fiber by white-light interferometry

Author(s):
Ye, Q. ( Shanghai Jiaotong Univ.(China) )
Xu, C. ( Lucent Technologies/Bell Labs.(USA) )
Liu, X.
Knox, W.H. ( The Institute of Optics/Univ. of Rochester (USA) )
Yan, M.F. ( Lucent Technologies/Bell Labs.(USA) )
Windeler, R.S.
Eggleton, B.J.
2 more
Publication title:
APOC 2001: Asia-Pacific Optical and Wireless Communications : Optical fiber and planar waveguide technology : 13-15 November 2001, Beijing, Chaina
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4579
Pub. Year:
2001
Page(from):
251
Page(to):
255
Pages:
5
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819443090 [0819443093]
Language:
English
Call no.:
P63600/4579
Type:
Conference Proceedings

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