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IOS Press
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Castellano, J.M., Vioque, B.
IOS Press
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Rombaldi, C.V., Silva, J.A., Wally, L., Lucchetta, L., Marini, L.J., Zanuzo, M.R.
IOS Press
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Ting-Kuo Huang, Michael A. Plesha, Mysore R. Sudarshana, Sandra L. Uratsu, David M. Tricoli
American Institute of Chemical Engineers
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Tumer N., hemenway C., O'Connell K., Cuozzo M., Fang -X. R., Kaniewski W., Chua -H. N.
Plenum Press
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de Carvalho, F., Boerjan, Ww., Ingelbrecht, I., Depicker, A., Inze, D., Van Montagu, M.
Springer-Verlag
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M. Horie, I. Sekiya, T. Muneta, T. Murakami, E. Kobayashi
Society of Photo-optical Instrumentation Engineers
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Sandhu,R.K., Kim,M.S., Krizek,D.T., Middleton,E.M.
SPIE-The International Society for Optical Engineering
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Wandelt Ch., Knibb W., Schroeder E. H., Khan I. R. M., Spencer D., Craig S., Higgins V. J. T.
Plenum Press
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Vroemen, C. W., Arts, N., In der Rieden, P. M. J., van Kammen, A., de Vries, S. C.
Springer-Verlag
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Perlick M. A., Fruhling M., Schroder G., Albus U., Frosch Ch. S., Becker J., Bohner S., Quandt -J. H., Broer I., Kuster …
Springer
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Islam A. U., Iftekharuddin K. M., Russomanno D. J.
SPIE - The International Society of Optical Engineering
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