|
Johnson M. A., Makioka A., Ellis T. J.
Springer-Verlag
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Perlado, J. M., Malerba, L., Rubia, T. Diaz de la
MRS - Materials Research Society
|
Gunsteren,W.F.Van, Bakowies,D., Damm,W., Hansson,T., Stocker,U., Daura,X.
IOS Press
|
Dauber, P., Osguthorpe, D., Sharon, R., Stern, P., Goodman, Murray, Hagler, A. T.
American Chemical Society
|
Jhih-Wei Chu, Nikolaos Voulgarakis
American Institute of Chemical Engineers
|
ERIKSSON. M, HARD. T, NIKSSON. L
Kluwer Academic Publishers
|
Dowling,J.A., Kelly,B.T., Gonglewski,J.D., Fox,M.J., Shilko,M.L., Higdon,N.S., Highland,R.G., Senft,D.C., Dean,D.R., …
SPIE-The International Society for Optical Engineering
|
Litvak S., Keclard-Christophe L., Echeverria M., Castroviejo M.
Plenum Press
|
Kaur, I., Bharadwaj, L.M., Dabas, R., Bhondekar, A.P., Shukla, A.K., Bhalla, V., Bajpai, R.P.
SPIE-The International Society for Optical Engineering
|
Steitz A. T., Beese L., Engelman B., Fremont P., Friedman J., Sanderson M., Schultz S., Shields G., Warwicker J.
Plenum Press
|
SCHLICK S., KEVAN L.
D. Reidel
|