Noncontact sensing of electric potential using electroluminescence effects
- Author(s):
- Jeong,D. ( LG Electronics, Inc. )
- Lee,J.-H.
- Yune,I.-J.
- Chae,S.-H.
- Bhattarai,B.B.
- Publication title:
- Optomechatronic systems II : 29-31 October 2001, Newton, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4564
- Pub. Year:
- 2001
- Page(from):
- 331
- Page(to):
- 338
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819442925 [0819442925]
- Language:
- English
- Call no.:
- P63600/4564
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Effects of pattern size, dual side patterning, and imprint materials in the fabrication of antireflective structure using nanoimprint
Society of Photo-optical Instrumentation Engineers |
2
Conference Proceedings
Noncontact wave sensing for damage detection in a rotating shaft using magnetostrictive sensors
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Compensators for dispersion and dispersion slope using fiber Bragg gratings [6353-69]
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
Electroluminescence and photovoltaic effects using columnar mesogenic compounds (Invited Paper)
SPIE-The International Society for Optical Engineering |
IEEE Computer Society Press |
Trans Tech Publications |
10
Conference Proceedings
Homoepitaxial Growth of Al-Doped 4H-SiC Using Bis-Trimethylsilylmethane Precursor
Trans Tech Publications |
5
Conference Proceedings
Measurement of thermal expansion coefficient of poly-Si using microgauge sensors
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
6
Conference Proceedings
Application of full-chip optical proximity correction for sub-60-nm memory device in polarized illumination
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Study on camera calibration parameters estimation using the perspective variation ratio
SPIE-The International Society for Optical Engineering |