"Nondestructive acoustic microimaging (AMI) analysis of MEMS materials, manufacturing, and packaging"
- Author(s):
- Martell,S.R. ( Sonoscan, Inc. )
- Semmens,J.E.
- Kessler,L.W.
- Publication title:
- Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4558
- Pub. Year:
- 2001
- Page(from):
- 260
- Page(to):
- 267
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819442864 [0819442860]
- Language:
- English
- Call no.:
- P63600/4558
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Evalution of Flip Chip Interconnects Using Acoustic Microscopy for Failure Analysis and Process Control Applications
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering, IMAPS |
American Institute of Chemical Engineers |
SPIE-The International Society for Optical Engineering |
Materials Research Society |
IMAPS, SPIE-The International Society for Optical |
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Imputation methods for temporal radiographic texture analysis in the detection of periprosthetic osteolysis
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
Probing the pore space in mesoporous solids with NMR spectroscopy and magnetic resonance microimaging
Elsevier |
MRS - Materials Research Society |
SPIE-The International Society for Optical Engineering |