Magnified hard x-ray microtomography: toward tomography with submicron resolution
- Author(s):
Schroer,C.G. ( RWTH-Aachen ) Benner,B. Gunzler,T.F. Kuhlmann,M. Lengeler,B. Rau,C. Weitkamp,T. Snigirev,A.A. Snigireva,I. - Publication title:
- Developments in x-ray tomography III : 2-3 August 2001, San Diego, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4503
- Pub. Year:
- 2001
- Page(from):
- 23
- Page(to):
- 33
- Pages:
- 11
- Pub. info.:
- Bellingham, Washington: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819442178 [0819442178]
- Language:
- English
- Call no.:
- P63600/4503
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
High-resolution element mapping inside biological samples using fluorescence microtomography
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Microbeam production using compound refractive lenses: beam characterization and applications
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Focusing hard x-ray FEL beams with parabolic refractive lenses (Invited Paper)
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
In-line phase contrast in synchrotron-radiation microradiography and tomography
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Full-field and scanning microtomography based on parabolic refractive x-ray lenses [6318-54]
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Fluorescence microtomography: external mapping of elements inside biological samples
SPIE-The International Society for Optical Engineering |