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Characterization of high-quality synthetic diamond crystals by μm-resolved x-ray diffractometry and topography

Author(s):
Hoszowska,J. ( European Synchrotron Radiation Facility )
Freund,A.K.
Ishikawa,T.
Sellschop,J.P.F.
Rebak,M.
Burns,R.C.
Hansen,J.O.
Welch,D.L.
Hall,C.E.
4 more
Publication title:
X-ray mirrors, crystals, and multilayers : 30-31 July 2001 San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4501
Pub. Year:
2001
Page(from):
106
Page(to):
117
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442154 [0819442151]
Language:
English
Call no.:
P63600/4501
Type:
Conference Proceedings

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