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PSF measurement of imaging detectors with an x-ray microbeam

Author(s):
Publication title:
X-ray and micro- and nano-focusing : applications and techniques : 31 July 2001 San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4499
Pub. Year:
2001
Page(from):
126
Page(to):
133
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819442130 [0819442135]
Language:
English
Call no.:
P63600/4499
Type:
Conference Proceedings

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