Novel integrating solid state detector with segmentation for scanning transmission soft x-ray microscopy

Novel integrating solid state detector with segmentation for scanning transmission soft x-ray microscopy

Author(s):

Feser,M. ( SUNY/Stony Brook )

Publication title:

X-ray and micro- and nano-focusing : applications and techniques : 31 July 2001 San Diego, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4499

Pub. Year:

2001

Page(from):

117

Page(to):

125

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819442130 [0819442135]

Language:

English

Call no.:

P63600/4499

Type:

Conference Proceedings

Details

TDL ID:	ZA00012205
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : X-ray and micro- and nano-focusing
Conf. info. (Number):	2001
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2001.07.31

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