Blank Cover Image

Large-area silicon immersion echelle gratings and grisms for IR spectroscopy

Author(s):
Publication title:
Optical spectroscopic techniques, remote sensing, and instrumentation for atmospheric and space research IV : 30 July-2 August 2001, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4485
Pub. Year:
2001
Page(from):
385
Page(to):
392
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441997 [0819441996]
Language:
English
Call no.:
P63600/4485
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Production of high-order micromachined silicon echelles on optically flat substrates

Ershov,O.A., Jaffe,D.T., Marsh,J.P., Keller,L.D.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Fabrication and performance of silicon immersion gratings for infrared spectroscopy [6269-167]

Jasmina P. Marsh, Douglas J. Mar, Daniel T. Jaffe

SPIE - The International Society of Optical Engineering
2 Conference Proceedings Micromachined silicon diffraction gratings for infrared spectroscopy

Jaffe,D.T., Keller,L.D., Ershov,O.A.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings A silicon and KRS-5 grism suite for FORCAST on SOFIA

C. P. Deen, L. Keller, K. A. Ennico, D. T. Jaffe, J. P. Marsh

Society of Photo-optical Instrumentation Engineers
3 Conference Proceedings Silicon grisms and immersion gratings produced by anisotropic etching: testing and analysis

Marsh, J.P., Ershov, O.A., Jaffe, D.T.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings Adaptive optics high-resolution IR spectroscopy with silicon grisms and immersion gratings

Ge, J., McDavitt, D.L., Chakraborty, A., Bernecker, J.L., Miller, S.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Infrared grisms using anisotropic etching of silicon to produce a highly asymmetric groove profile

Ershov, O.A., Marsh, J.P., Allers, K.N., Jaffe, D.T.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Grsm performance for mid-IR (5-40 micron) spectroscopy [6269-64]

Ennico, K. A., Keller, L. D., Mar, D. J., Herter, T. L., Jaffe, D. T., Adams, J. D., Greene, T. P.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Design for a near-infrared immersion echelle spectrograph:breaking the R= 100,000 barrier from 1.5 to 5 ｦﾌm

Keller,L.D., Jaffe,D.T., Doppmann,G.W.

SPIE-The International Society for Optical Engineering
11 Conference Proceedings Silicon immersion grating spectrograph design for the NASA Infrared Telescope Facility

A. T. Tokunaga, T. Bond, D. T. Jaffe, M. J. Mumma, J. T. Rayner

Society of Photo-optical Instrumentation Engineers
6 Conference Proceedings Performance of large chemically etched silicon grisms for infrared spectroscopy [6269-212]

D. J. Mar, J. P. Marsh, D. T. Jaffe, L. D. Keller, K. A. Ennico

SPIE - The International Society of Optical Engineering
12 Conference Proceedings EXES:an echelon cross echelle spectrograph for SOFIA

Richter,M.J., Lacy,J.H., Jaffe,D.T., Hemenway,M., Yu,W.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12