Blank Cover Image

Dual-fiber optic microcantilever proximity sensor

Author(s):
Publication title:
Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4468
Pub. Year:
2001
Page(from):
161
Page(to):
170
Pages:
10
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441829 [0819441821]
Language:
English
Call no.:
P63600/4468
Type:
Conference Proceedings

Similar Items:

Senesac,L.R., Farahi,R.H., Corbeil,J.L., Earl,D.D., Rajic,S., Datskos,P.G.

SPIE-The International Society for Optical Engineering

Rajic,S., Datskos,P.G.

SPIE-The International Society for Optical Engineering

Datskos, P.G., Rajic, S., Lavrik, N.V.

SPIE - The International Society of Optical Engineering

Datskou,I., Rajic,S., Datskos,P.G.

SPIE-The International Society for Optical Engineering

Rajic, S., Datskos, P.G.

SPIE-The International Society for Optical Engineering

Rajic,S., Datskos,P.G., Datskou,I.

SPIE - The International Society for Optical Engineering

Rajic,S., Evans,B.M.III, Datskos,P.G., Oden,P.I., Thundat,T.G., Egert,C.M.

SPIE-The International Society for Optical Engineering

Datskou,I., Rajic,S., Datskos,P.G.

SPIE - The International Society for Optical Engineering

Muralidharan, G., Wig, A., Pinnaduwage, L.A., Hedden, D.L., Datskos, P.G., Thundat, T., Lareau, R.T.

Materials Research Society

Datskos,P.G., Rajic,S., Datskou,I, Egert,C. M.

SPIE-The International Society for Optical Engineering

Rajic,S., Datskos,P.G., Datskou,I., Marlar,T.A.

SPIE - The International Society for Optical Engineering

Goedeke S. M., Hollerman W. A., Bergeron N. P., Allison S. W., Moore R. J.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12