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Fast-scanning near-field scanning optical microscopy using a high-frequency dithering probe

Author(s):
Publication title:
Controlling and using light in nanometric domains : 2-3 August 2001 San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4456
Pub. Year:
2001
Page(from):
119
Page(to):
126
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441706 [0819441708]
Language:
English
Call no.:
P63600/4456
Type:
Conference Proceedings

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