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RIE-induced n-on-p junction HgCdTe photodiodes: effects of passivant technology on bake stability

Author(s):
Dell,J.M. ( Univ. of Western Australia )
Antoszewski,J.
White,J.K.
Pal,R.
Nguyen,T.
Musca,C.A.
Faraone,L.
2 more
Publication title:
Materials for infrared detectors : 30 July-1 August 2001, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4454
Pub. Year:
2001
Page(from):
106
Page(to):
115
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441683 [0819441686]
Language:
English
Call no.:
P63600/4454
Type:
Conference Proceedings

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