Optical characterization of edge-emitting LEDs (EELEDs) for scanning display applications

Author(s):

• Altendorf,E.H. ( Microvision, Inc. )
• Gong,T.J.
• Brown,M.K.
• Nissen,J.

Publication title:

Solid state lighting and displays : 31 July-1 August 2001, San Diego, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4445

Pub. Year:

2001

Page(from):

111

Page(to):

118

Pages:

8

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819441591 [0819441597]

Language:

English

Call no.:

P63600/4445

Type:

Conference Proceedings