Blank Cover Image

Oxygenation measurements with optical coherence tomography

Author(s):
Publication title:
Photon migration, optical coherence tomography, and microscopy : 18-21 June 2001, Munich, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4431
Pub. Year:
2001
Page(from):
20
Page(to):
24
Pages:
5
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441454 [0819441457]
Language:
English
Call no.:
P63600/4431
Type:
Conference Proceedings

Similar Items:

Faber,D.J., Mik,E.G., Aalders,M.C.G., Meer,F.J.van der, Leeuwen,T.G.van

SPIE-The International Society for Optical Engineering

Faber, D.J., Aalders, M.C.G., Mik, E.G., Hooper, B.A., van Leeuwen, T.G.

SPIE - The International Society of Optical Engineering

Meer,F.J.van de, Faber,D.J., Aalders,M.C.G., Perree,J., Leeuwen,T.G.van

SPIE-The International Society for Optical Engineering

Faber, D. J., Van der Meer, F. J., Aalders, M. C. G., Van Leeuwen, T. G.

SPIE - The International Society of Optical Engineering

Faber, D.J., Aalders, M.C.G., Mik, E.G., Hooper, B.A., van Leeuwen, T.G.

SPIE - The International Society of Optical Engineering

van der Meer, F. J., Faber, D. J., Aalders, M. C., Perree, J., van Leeuwen, T. G.

SPIE - The International Society of Optical Engineering

Meer,F.J.van der, Faber,D.J., Bruin,R.de, Aalders,M.C., Perree,J., Leeuwen,T.G.van

SPIE-The International Society for Optical Engineering

Leeuwen, T.G.J.M., Faber, D.J., Meer, F., Aalders, M.C.

SPIE-The International Society for Optical Engineering

Meer, F.J., Faber, D.J., Aalders, M.C., Leeuwen, T.G.J.M.

SPIE-The International Society for Optical Engineering

Faber, D.J., Mik, E.G., Aalders, M.C., Leeuwen, T.G.J.M.

SPIE-The International Society for Optical Engineering

Faber, D. J., van der Meer, F. J., Aalders, M. C. G., de Bruin, D. M., van Leeuwen, T. G.

SPIE - The International Society of Optical Engineering

Meer, F. J. van der, Perree, J., Faber, D. J., Bassoon, D. M. Baraznji, Aalders, M. C., Leeuwen, T. G. van

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12