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Portable residual stress measurement device using ESPI and a radial in-plane interferometer

Author(s):
Publication title:
Laser metrology for precision measurement and inspection in industry : 13-15 October 1999, Florianópolis, Brazil
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4420
Pub. Year:
1999
Page(from):
112
Page(to):
122
Pages:
11
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441270 [0819441279]
Language:
English
Call no.:
P63600/4420
Type:
Conference Proceedings

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