Micro-moire methods: optical and scanning techniques
- Author(s):
- Asundi,A.K. ( Nanyang Technological Univ. )
- Xie,H.
- Li,C.
- Chai,G.B.
- Oh,K.E.
- Publication title:
- Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4416
- Pub. Year:
- 2001
- Page(from):
- 54
- Page(to):
- 57
- Pages:
- 4
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819441218 [081944121X]
- Language:
- English
- Call no.:
- P63600/4416
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society for Optical Engineering |
7
Conference Proceedings
Measurement of thermal deformation of IC packages using the AFM scanning moire technique
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Photoelastic stress analysis of internal fixation techniques for femur shaft crack
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
9
Conference Proceedings
Thermal deformation of electronic package using scanning moire method with high-resolution microscopy
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Grid method for strain measurement in electronic packaging using optical,electronic,and atomic force microscope
SPIE - The International Society for Optical Engineering |
5
Conference Proceedings
Thermal deformation measurement of electronic packaging component using AFM scanning moire method
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Micro-moire for thermal deformation investigation in electronics packaging
SPIE-The International Society for Optical Engineering |