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Stress-induced effects in semiconducting epitaxial layers

Author(s):
Bak-Misiuk,J. ( Institute of Physics )
Domagala,J.
Misiuk,A.
Kaniewski,J.
Adamczewska,J.
Trela,J.
Reginski,K.
Dobosz,D.
Prujszczyk,M.
Tedenac,J.C.
5 more
Publication title:
International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4413
Pub. Year:
2000
Page(from):
262
Page(to):
266
Pages:
5
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441164 [0819441163]
Language:
English
Call no.:
P63600/4413
Type:
Conference Proceedings

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