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Scanning probe microscopy/spectroscopy and its applications for nanotechnology

Author(s):
Publication title:
International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4413
Pub. Year:
2000
Page(from):
182
Page(to):
187
Pages:
6
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819441164 [0819441163]
Language:
English
Call no.:
P63600/4413
Type:
Conference Proceedings

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