Virtual CMM using Monte Carlo methods based on frequency content of the error signal
- Author(s):
- Dorp,B.W.van ( Eindhoven Univ. of Technology )
- Haitjema,H.
- Delbressine,F.
- Bergmans,R.H.
- Schellekens,P.H.J.
- Publication title:
- Recent developments in traceable dimensional measurements : 20-21 June 2001, Munich, Germany
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4401
- Pub. Year:
- 2001
- Page(from):
- 158
- Page(to):
- 167
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819440969 [0819440965]
- Language:
- English
- Call no.:
- P63600/4401
- Type:
- Conference Proceedings
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