Absolute optical path difference measurement with angstrom accuracy over ranges of millimeters
- Author(s):
- Krieg,M.L. ( Delft Univ. of Technology )
- Klaver,R.G.
- Braat,J.J.M.
- Publication title:
- Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4398
- Pub. Year:
- 2001
- Page(from):
- 116
- Page(to):
- 126
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819440938 [0819440930]
- Language:
- English
- Call no.:
- P63600/4398
- Type:
- Conference Proceedings
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