SLM operating curves for statistical pattern recognition metrics

Author(s):

• Juday,R.D. ( NASA Johnson Space Ctr. )
• Rollins,J.M.
• Monroe Jr.,S.E.

Publication title:

Optical pattern recognition XII : 19 April, 2001, Orlando, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4387

Pub. Year:

2001

Page(from):

27

Page(to):

40

Pages:

14

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819440822 [0819440825]

Language:

English

Call no.:

P63600/4387

Type:

Conference Proceedings