Sapphire statistical characterization and risk reduction program

Sapphire statistical characterization and risk reduction program

Author(s):

McClure,D.R. ( U.S. Army Space and Missile Defense Command )

Publication title:

Window and dome technologies and materials VII : 16-17 April 2001, Orlando, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4375

Pub. Year:

2001

Page(from):

20

Page(to):

30

Pages:

11

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819440709 [0819440701]

Language:

English

Call no.:

P63600/4375

Type:

Conference Proceedings

Details

TDL ID:	ZA00012091
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Window and dome technologies and materials
Conf. info. (Number):	2001 : 7th
Conf. info. (Venue):	Orlando, FL, USA
Conf. info. (Date):	2001.04.16-2001.04.17

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