Junction formation by hydrogenation for HgCdTe diodes
- Author(s):
- Publication title:
- Infrared technology and applications XXVII : 16-20 April 2001, Orlando, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4369
- Pub. Year:
- 2001
- Page(from):
- 412
- Page(to):
- 418
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819440648 [0819440647]
- Language:
- English
- Call no.:
- P63600/4369
- Type:
- Conference Proceedings
Similar Items:
SPIE |
SPIE |
SPIE |
8
Conference Proceedings
Comparison of MOSFET Characteristics Between ALD and MOCVD TiN Metal Gate on Hf Silicate
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
SPIE |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Design of Manufacturing Process of Oxygen-Free High Conductivity Copper Using Mahalanobis-Distance Outlier Detection Method
Trans Tech Publications |
SPIE |
Trans Tech Publications |
6
Conference Proceedings
Surface treatment effects on the surface recombination velocity of ZnS/HgCdTe interface
SPIE - The International Society for Optical Engineering |
12
Conference Proceedings
Study of 4H-SiC Junction Barrier Schottky(JBS) Diode Using Various Junction Structures
Trans Tech Publications |