Application of full-chip level optical proximity correction to memory device with sub-0.10-μm design rule and ArF lithography
- Author(s):
Yune,H.-S. ( Hyundai Electronics Industries Co., Ltd. ) Kim,H.-B. Kim,W.-H. Ahn,C.-N. Ham,Y.-M. Shin,K.-S. - Publication title:
- Optical Microlithography XIV
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4346
- Pub. Year:
- 2001
- Vol.:
- 4346
- Pt.:
- One of Two Parts
- Page(from):
- 241
- Page(to):
- 250
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819440327 [0819440329]
- Language:
- English
- Call no.:
- P63600/4346
- Type:
- Conference Proceedings
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