Blank Cover Image

Tolerance issues in solid immersion lens systems

Author(s):
Publication title:
Optical data storage 2001 : 22-25 April 2001 Santa Fe, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4342
Pub. Year:
2001
Page(from):
312
Page(to):
319
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819440280 [0819440280]
Language:
English
Call no.:
P63600/4342
Type:
Conference Proceedings

Similar Items:

Shimura,K., Milster,T.D., Hirota,K., Io,J.S.

SPIE - The International Society for Optical Engineering

Chen, T., Felix, D., Park, S. -K., Hauser, P., McCarthy, B., Sarid, D., Poweleit, C., Menendez, J., Milster, T. D.

SPIE - The International Society of Optical Engineering

Hirota,K., Milster,T.D., Shimura,K., Zhang,Y., Jo,J.S.

SPIE - The International Society for Optical Engineering

Milster,T.D., Upton,R.S., Luo,H.

SPIE-The International Society for Optical Engineering

Hirota, Kusato, Jo, Joshua S., Milster, Tom D.

SPIE

N.-C. Park, Y.-J. Yoon, Y.-H. Lee, J.-G. Kim, W.-C. Kim, H. Choi, S. Lim, T.-M. Yang, M.-H. Choi, H. Yang, Y.-C. Rhim, …

SPIE - The International Society of Optical Engineering

Jo,J.S., Milster,T.D., Erwin,J.K.

SPIE - The International Society for Optical Engineering

Milster,T.D.

SPIE-The International Society for Optical Engineering

5 Conference Proceedings Design issues in optical data storage

T.D. Milster

Society of Photo-optical Instrumentation Engineers

Milster,T.D.

SPIE - The International Society for Optical Engineering

Milster, T., Chen, T., Nam, D., Schlesinger, T. E.

SPIE - The International Society of Optical Engineering

Beaudry,N.A., Milster,T.D.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12