Beiden,S.V., Wagner,R.F., Campbell,G., Metz,C.E., Jiang,Y., Chan,H.-P.
SPIE-The International Society for Optical Engineering
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Reiser, I., Metz, C.E., Nishikawa, R.M.
SPIE - The International Society of Optical Engineering
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Wagner,R.F., Beiden,S.V., Campbell,G.
SPIE-The International Society for Optical Engineering
|
Jiang,Y., Metz,C.E.
SPIE-The International Society for Optical Engineering
|
Jiang,Y., Nishikawa,R.M., Schmidt,R.A., Metz,C.E., Doi,K.
SPIE - The International Society for Optical Engineering
|
Beiden, S.V., Wagner, R.F., Doi, K., Nishikawa, R.M., Freedman, M.T., Lo, S.-C.B., Xu, X.-W.
SPIE-The International Society for Optical Engineering
|
Wagner, R.F., Beiden, S.V., Campbell, G., Metz, C.E., Sacks, W.M.
SPIE-The International Society for Optical Engineering
|
Edwards, D.C., Metz, C.E., Nishikawa, R.M.
SPIE - The International Society of Optical Engineering
|
Beiden, S.V., Maloof, M.A., Wagner, R.F.
SPIE-The International Society for Optical Engineering
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R.M. Nishikawa, R.C. Haldemann, J. Papaioannou, M.L. Giger, P. Lu
Society of Photo-optical Instrumentation Engineers
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Jiang,Y., Nishikawa,R.M.
SPIE - The International Society for Optical Engineering
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Jiang, Y., Schmidt, R.A., Nishikawa, R.M., D'Orsi, C.J., Vyborny, C.J., Newstead, G.M.
SPIE - The International Society of Optical Engineering
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