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Design of radiation hard CMOS APS image sensors in a 0.35-μm standard process

Author(s):
Eid,E.-S. ( Photobit Corp. )
Chan,T.Y.
Fossum,E.R.
Tsai,R.H.
Spagnuolo,R.
Deily,J.J.
1 more
Publication title:
Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4306
Pub. Year:
2001
Page(from):
50
Page(to):
59
Pages:
10
Pub. info.:
Bellingham, Washington: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439840 [0819439843]
Language:
English
Call no.:
P63600/4306
Type:
Conference Proceedings

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