"Defect review in the photonics revolution: the critical role of near-field optics in the characterization of waveguides, optical interconnects, optical and electro-optical switches, lasers and their integrated emulations"

"Defect review in the photonics revolution: the critical role of near-field optics in the characterization of waveguides, optical interconnects, optical and electro-optical switches, lasers and their integrated emulations"

Author(s):: Lewis,A. ( Nanonics Imaging Ltd. )
Publication title:: WDM and Photonic Switching Devices for Network Applications II
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 4289
Pub. Year:: 2001
Page(from):: 59
Page(to):: 64
Pages:: 6
Pub. info.:: Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:: 0277786X
ISBN:: 9780819439673 [0819439673]
Language:: English
Call no.:: P63600/4289
Type:: Conference Proceedings

Details

TDL ID:	ZA00012005
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : WDM and photonic switching devices for network applications
Conf. info. (Number):	2001 : 2nd
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2001.01.25-2001.01.26

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