Packaging and characterization equipment for high-power diode laser bars and VCSELs

Packaging and characterization equipment for high-power diode laser bars and VCSELs

Author(s):

Boucke,K. ( Fraunhofer Institute for Laser Technology )

Publication title:

Testing, Reliability, and Applications of Optoelectronic Devices

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4285

Pub. Year:

2001

Page(from):

165

Page(to):

172

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819439635 [0819439630]

Language:

English

Call no.:

P63600/4285

Type:

Conference Proceedings

Details

TDL ID:	ZA00012001
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Testing, reliability, and applications of optoelectronic devices
Conf. info. (Number):	2001
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2001.01.24-2001.01.26

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