Blank Cover Image

Resolution enhancement using a diffraction grating for optical triangulation displacement sensors

Author(s):
Publication title:
Testing, Reliability, and Applications of Optoelectronic Devices
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4285
Pub. Year:
2001
Page(from):
102
Page(to):
108
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439635 [0819439630]
Language:
English
Call no.:
P63600/4285
Type:
Conference Proceedings

Similar Items:

Kim,K.-C., Oh,S.B., Kim,S.H., Kwak,Y.K.

SPIE-The International Society for Optical Engineering

Han, Y. G., Kim, C. S., Oh, K., Paek, U. C., Chung, Y.

SPIE - The International Society of Optical Engineering

Kim,K.-C., Kim,J.-A., Oh,S.-B., Kim,S., Kwak,Y.K.

SPIE - The International Society for Optical Engineering

Moon,S.W., Lim,S.H., Lee,S.B., Kang,H.K., Kim,M.C., Han,S.H., Oh,M.H.

SPIE - The International Society for Optical Engineering

Ko, W.S., Oh, S.B., Kim, S.H., Kwak, Y.K.

SPIE - The International Society of Optical Engineering

S.H. Oh, C.S. Kim, B.S. Rho, S.B. Jung, M.Y. Jeong

Trans Tech Publications

Kim,J.-A., Kim,K.-C., Bae,E.W., Kim,S., Kwak,Y.K.

SPIE - The International Society for Optical Engineering

Han, S.H., Park, J.H., Kim, H., Yang, B.C., Paek, J.W., Lee, B.H.

SPIE-The International Society for Optical Engineering

Bae,E.W., Kim,J.-A., Kim,S.H., Kwak,Y.K.

SPIE-The International Society for Optical Engineering

Ahn, J.K., Choi, S.H., Kim, Y.K., Park, K.Y., Choi, J.S., Hong, E.S., Shin, K.S., Kim, S.B., Choi, K.K., Hwang, S.B., …

SPIE - The International Society of Optical Engineering

Song,J.-H., Kim,K.-C., Kim,S.-H., Kwak,Y.K.

SPIE - The International Society for Optical Engineering

Lim,H.-J., Lim,Y.-M., Kim,S.H., Kwak,Y.K.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12