Depth-image-based surface measurement sensor
- Author(s):
- Publication title:
- Metrology-based Control for Micro-Manufacturing
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4275
- Pub. Year:
- 2001
- Page(from):
- 94
- Page(to):
- 98
- Pages:
- 5
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819439536 [0819439533]
- Language:
- English
- Call no.:
- P63600/4275
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Wavelet-based compression of pathological images for telemedicine applications
SPIE - The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
11
Conference Proceedings
Research on obtaining range image based on structured light and stripe encoding
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Optimum designs of 30-km distributed optical fiber Raman photon temperature sensors and measurement network
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Hybrid mode-locking based on nonlinear polarization rotation in a SOA fiber ring laser
Society of Photo-optical Instrumentation Engineers |