Blank Cover Image

I2-stabilized 633-nm He-Ne lasers: 25 years of international comparisons

Author(s):
Publication title:
Laser Frequency Stabilization, Standards, Measurement, and Applications
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4269
Pub. Year:
2001
Page(from):
123
Page(to):
133
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439475 [0819439479]
Language:
English
Call no.:
P63600/4269
Type:
Conference Proceedings

Similar Items:

G.V. Popescu, J.-M. Chartier, A. Chartier, A. Zarka

Society of Photo-optical Instrumentation Engineers

Rigau,J., Sun,C.-H., Trelles,M.A., Berns,M.W.

SPIE-The International Society for Optical Engineering

Chartier,J.-M., Vitushkin,L.F., Khaleev,M., Novikov,G.E., Orlov,O.A., Terekhov,S., Ustyugov,V.I.

SPIE-The International Society for Optical Engineering

Kadkhoda,P., Amra,C., Bennett,J.M., Deumie,C., Duparre,A., Gliech,S., Jolie,C., Kessler,H., Lauth,H., Lindstroem,T., …

SPIE - The International Society for Optical Engineering

3 Conference Proceedings 25 YEARS OF LASER INSTABILITIES

Lugiato A. L., Narducci M. L., Tredicce R. J., Bandy K. D.

Plenum Press

Kanskar M., Cai J., Galstad C., He Y., Macomber S. H., Stiers E., Tatavarti-Bharatam S. R., Botez D., Mawst L. J.

SPIE - The International Society of Optical Engineering

F. Bertinetto, P. Cordiale, G.V. Popescu

Society of Photo-optical Instrumentation Engineers

Erin,M., Malinovsky,I., Titov,A.

SPIE-The International Society for Optical Engineering

Egle,W.J., Altmann,J., Hasselmann,W., Merkle,F., Beckstette,K.F., Schmidt,M.

SPIE - The International Society for Optical Engineering

Lubart,R., Friedmann,H., Grossmann,N., Synakov,M., Adamek,M., Shainberg,A.

SPIE-The International Society for Optical Engineering

Popescu,G., Chartier,J.-M., Bertinetto,F., Petru,F.

SPIE-The International Society for Optical Engineering

Stolz,C.J., Genin,F.Y., Reitter,T.A., Molau,N.E., Bevis,R.P., Gunten,M.K.Von, Smith,D.J., Anzellotti,J.F.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12