Blank Cover Image

Environment-induced failure modes of thin film resonators

Author(s):
Publication title:
Smart materials
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4234
Pub. Year:
2000
Page(from):
258
Page(to):
268
Pages:
11
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819439086 [0819439088]
Language:
English
Call no.:
P63600/4234
Type:
Conference Proceedings

Similar Items:

Kazinczi, R., Mollinger, J.R., Bossche, A.

Materials Research Society

Bossche,A., Cotofana,C.V.B., Kaldenberg,P., Van Dommelen,I., Mollinger,J.R.

SPIE-The International Society for Optical Engineering

2 Conference Proceedings Design of low-cost resonant mode sensors

Kazinczi, R., Turmezei, P., Mollinger, J.R., Bossche, A.

SPIE-The International Society for Optical Engineering

8 Conference Proceedings Fracture - An Unforgiving Failure Mode

J.R. Goodin

ESA Communications

Kazinczi,R., Mollinger,J.R., Bossche,A.

SPIE - The International Society for Optical Engineering

Moody, N.R., Bahr, D.F., Kent, M.S., Emerson, J.A., Reedy, E.D., Jr.

Materials Research Society

Kutchoukov, V. G., Mollinger, J.R., Bossche, A.

SPIE-The International Society for Optical Engineering

Kobrin,P.H., Seabury,C., Linnen,C., Harker,A.B., Chung,R., McGill,R.A., Matthews,P.J.

SPIE-The International Society for Optical Engineering

Bossche,A., Cotofana,C.B.V., Mollinger,J.R.

SPIE-The International Society for Optical Engineering

Linnen,C., Kobrin,P.H., Seabury,C., Harker,A.B., McCill,R.A., Houser,E.J., Chung,R., Weber,R., Swager,T.M.

SPIE - The International Society for Optical Engineering

Cotofana,C.V.B., Bossche,A., Mollinger,J.R., Kaldenberg,P.

SPIE-The International Society for Optical Engineering

Gungor, M. R., Gray, L. J., Zhou, S. J., Maroudas, D.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12