Error analysis of shorter demodulation algorithms for phase-shifting interferometry

Error analysis of shorter demodulation algorithms for phase-shifting interferometry

Author(s):

Publication title:

Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4231

Pub. Year:

2000

Page(from):

555

Page(to):

557

Pages:

3

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819439048 [0819439045]

Language:

English

Call no.:

P63600/4231

Type:

Conference Proceedings

Details

TDL ID:	ZA00011949
Series ID:	PA00000029
Conf. info. (Name):	Advanced Optical Manufacturing and Testing Technology
Conf. info. (Number):	2000
Conf. info. (Venue):	Chengdu, China
Conf. info. (Date):	2000.11.01-2000.11.03

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