Novel algorithm for hot-carrier lifetime projection on thick gate PMOSFETs fabricated by 0.18-μm CMOS technology
- Author(s):
- Publication title:
- Microelectronic Yield, Reliability, and Advanced Packaging
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4229
- Pub. Year:
- 2000
- Page(from):
- 21
- Page(to):
- 27
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819439017 [0819439010]
- Language:
- English
- Call no.:
- P63600/4229
- Type:
- Conference Proceedings
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