Measurement and analysis of reticle and wafer-level contributions to total CD variation
- Author(s):
- Publication title:
- Microlithographic Techniques in Integrated Circuit Fabrication II
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4226
- Pub. Year:
- 2000
- Page(from):
- 169
- Page(to):
- 177
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438980 [0819438987]
- Language:
- English
- Call no.:
- P63600/4226
- Type:
- Conference Proceedings
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