Blank Cover Image

Seal imprint recognition with joint transform correlators

Author(s):
Publication title:
Process Control and Inspection for Industry
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4222
Pub. Year:
2000
Page(from):
396
Page(to):
403
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437945 [0819437948]
Language:
English
Call no.:
P63600/4222
Type:
Conference Proceedings

Similar Items:

Fang,J.-S., Chen,C., Wang,S.

SPIE - The International Society for Optical Engineering

C. Lee, C. Chen, C. Wang

Society of Photo-optical Instrumentation Engineers

Chen, C.L., Wu, W.-J.

SPIE-The International Society for Optical Engineering

F. Chen, C. Li, D. Liu, W. Wang

Society of Photo-optical Instrumentation Engineers

Wang, W., Chen, Y., Liang, C., Miao, H.

SPIE - The International Society of Optical Engineering

Park,S.-J., Seo,D.-H., Kim,J.-Y., Bae,J.-K., Kim,C.-S., Kim,S.-J.

SPIE-The International Society for Optical Engineering

4 Conference Proceedings Design of a joint transform correlator

Comastri,S.A., Simon,J.M.

SPIE-The International Society for Optical Engineering

Campos,J., Ledesma,S.A., Iemmi,C.C., Yzuel,M.J.

SPIE-The International Society for Optical Engineering

Lee C., Chen C.

SPIE - The International Society of Optical Engineering

An,C., Minemoto,T.

SPIE-The International Society for Optical Engineering

C. Lee, C. Chen, K. Gu, Y. Hou

SPIE - The International Society of Optical Engineering

Wang,Y., Cai,L., Wang,H., Guo,C., Liu,H.-K.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12