Fast algorithm of calculating invariant features for image matching

Fast algorithm of calculating invariant features for image matching

Author(s):

Publication title:

Process Control and Inspection for Industry

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4222

Pub. Year:

2000

Page(from):

153

Page(to):

157

Pages:

5

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819437945 [0819437948]

Language:

English

Call no.:

P63600/4222

Type:

Conference Proceedings

Details

TDL ID:	ZA00011941
Series ID:	PA00000029
Conf. info. (Name):	Optics and Optoelectronic Inspection and Control : Process Control and Inspection for Industry
Conf. info. (Number):	2000
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2001.11.08-2000.11.10

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