Blank Cover Image

Application of holographic interferometry in engineering fracture mechanics

Author(s):
Publication title:
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4221
Pub. Year:
2000
Page(from):
283
Page(to):
286
Pages:
4
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438928 [0819438928]
Language:
English
Call no.:
P63600/4221
Type:
Conference Proceedings

Similar Items:

Yu,G., Zhou,H., Qi,X., Zhang,X., Li,H.

SPIE-The International Society for Optical Engineering

7 Conference Proceedings Low-order AO system in LAMOST [6272-126]

Yuan, X., Cui, X., Liu, G., Zhang, Y., Qi, Y.

SPIE - The International Society of Optical Engineering

2 Conference Proceedings Optical measuring method of rail wear

Qi,X., Zhou,J., Yu,G., Zou,F.

SPIE-The International Society for Optical Engineering

Sun,G., Zhang,X., Du,L.

SPIE-The International Society for Optical Engineering

Chen,G., Yu,L., Liu,F.

SPIE-The International Society for Optical Engineering

Gong, Y., Yan, C., Fang, L., Chen, M., Yu, D.

SPIE - The International Society of Optical Engineering

Yuan,L., Yu,G., Qi,X., Zhou,J.

SPIE-The International Society for Optical Engineering

Zou, X.F., Zhang, Y.N., Hou, D.L., Zhu, G.Z., Cheng, Z.H., Yu, W.F.

SPIE-The International Society for Optical Engineering

Zou,Q., Yu,W., Qi,L., Yu,D.

SPIE-The International Society for Optical Engineering

Rainova, Yu. P., Pezoldt, J., Antonenko, K. I., Eichhorn, G.

MRS - Materials Research Society

BEDARIDA F.

D. Reidel

F. A. Simonen, S. R. Gosselin, G. M. Wilkowski, D. L. Rudland, H. Xu

American Society of Mechanical Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12