Image-based recognition of the chip shape
- Author(s):
- Publication title:
- Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4221
- Pub. Year:
- 2000
- Page(from):
- 230
- Page(to):
- 233
- Pages:
- 4
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438928 [0819438928]
- Language:
- English
- Call no.:
- P63600/4221
- Type:
- Conference Proceedings
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