3D en face imaging by OCT

3D en face imaging by OCT

Author(s):

Publication title:

Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4221

Pub. Year:

2000

Page(from):

28

Page(to):

31

Pages:

4

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819438928 [0819438928]

Language:

English

Call no.:

P63600/4221

Type:

Conference Proceedings

Details

TDL ID:	ZA00011940
Series ID:	PA00000029
Conf. info. (Name):	Optics and Optoelectronic Inspection and Control : Optical measurement and nondestructive testing
Conf. info. (Number):	2000
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2000.11.08-2000.11.10

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