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"Design-Oriented Measurement-based Scaleable Models for Mutilayer MCM-D Integrated Passives, Implementation in a Design Library offering Automated Layout"

Author(s):
Carchon,G.
Nauwelaers,B.
Schreurs,D.
Vandenberghe,S.
Beyne,E.
Brebels,S.
Raedt,W.De
Pieters,P.
Vaesen,K.
4 more
Publication title:
2000 International Conference on High-Density Interconnect and Systems Packaging, 25-28 April 2000, The Adam's Mark Hotel, Denver, Colorado, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4217
Pub. Year:
2000
Page(from):
196
Page(to):
201
Pages:
6
Pub. info.:
Reston, VA — Bellingham, Wash.: IMAPS — SPIE-The International Society for Optical
ISSN:
0277786X
ISBN:
9780930815608 [0930815602]
Language:
English
Call no.:
P63600/4217
Type:
Conference Proceedings

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