ISS external contamination surface morphology studies

ISS external contamination surface morphology studies

Author(s):

Publication title:

Optomechanical engineering 2000 : 7-8 November 2000, Boston, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

4198

Pub. Year:

2000

Page(from):

108

Page(to):

121

Pages:

14

Pub. info.:

Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819438638 [0819438634]

Language:

English

Call no.:

P63600/4198

Type:

Conference Proceedings

Details

TDL ID:	ZA00011917
Series ID:	PA00000029
Conf. info. (Name):	Photonics East : Optomechanical engineering
Conf. info. (Number):	2000
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2000.11.07-2000.11.08

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