Blank Cover Image

High-precision encoder using moire fringe and neural network

Author(s):
Publication title:
Optomechatronic systems : 5-6 November 2000, Boston, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4190
Pub. Year:
2000
Page(from):
1
Page(to):
8
Pages:
8
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819438553 [0819438553]
Language:
English
Call no.:
P63600/4190
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Sliding mode control using neural network for IPM machine

M. C. Kim, J. H. Kim, S. K. Park, T. S. Yoon

Society of Photo-optical Instrumentation Engineers
7 Conference Proceedings Helicity Dependence of Moire Fringes Formed by a Helical Grating

Yuk,K.C., Lee,H.B., Jo,J.H., Chang,S.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Precise Measurement of Linear Displacements by Moire Fringes of Elongated Circular Gratings,

Song,J.S., Kim,B.J., Jo,J.H., Chang,S., Yuk,K.C.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Feedforward neural network using a liquid crystal smart pixel spatial light modulator

Kane,J.S.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Temporal encoding of multispectral satellite imagery for segmentation using pulsed coupled neural networks

G.L. Tarr, R.A. Carreras, J.S. Fender, X. Clastres, L. Freyss

Society of Photo-optical Instrumentation Engineers
9 Conference Proceedings Extraction of exposure parameters by using neural networks

Jeon, K.-A., Kim, H.-H., Yoo, J.-Y., Park, J.-T., Oh, H.-K.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Impact of mask defect in a high MEEF process

Jeong, C.-Y., Park, K.-Y., Choi, J.S., Lee, J.G., Lee, D.-H.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Dynamic moire interferometry

Buescher,B.J.,Jr, Bruck,H.A., Deason,V.A., Ricks,K.L., Epstein,J.S.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Damage Detection Using Neural Networks and Transfer Function Correlation

Lew,J.S.

Society for Experimental Mechanics
11 Conference Proceedings Fully optical backplane system using novel optical plug aand slot [6014-19]

Cho I.-K., Ahn S.-H., Lee W.-J., Han S.-H., Kim J.-T., Choi C.-K., Shin K., Yoon K. B., Jeong M.-Y., Park H. H.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Face detection and recognition using geometrical features and a neural network verifier [6202-05]

Yoon S. H., Park G., Hur G. T., Kim J. H.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Neural network for change detection of remotely sensed imagery

C.F. Chen, K.S. Chen, J.S. Chang

Society of Photo-optical Instrumentation Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12