Multibeam high-resolution UV wavelength reticle inspection
- Author(s):
Hung,C.C. Yoo,C.S. Lin,C.-H. Volk,W.W. Wiley,J.N. Khanna,S. Biellak,S. Wang,D. - Publication title:
- 20th Annual BACUS Symposium on Photomask Technology
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4186
- Pub. Year:
- 2000
- Page(from):
- 165
- Page(to):
- 172
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438492 [0819438499]
- Language:
- English
- Call no.:
- P63600/4186
- Type:
- Conference Proceedings
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