Characterization and design optimization for CMOS-compatible MEMS
- Author(s):
- Publication title:
- Materials and Device Characterization in Micromachining III
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4175
- Pub. Year:
- 2000
- Page(from):
- 170
- Page(to):
- 179
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819438317 [0819438316]
- Language:
- English
- Call no.:
- P63600/4175
- Type:
- Conference Proceedings
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